Data
analysis sheet for in-plane length
measurements when the transitional
edges
defining L are oriented in
the same direction (or for an inside
edge-to-outside edge length
measurement from one data trace)
Figure L.2.1.
Top view of a fixed-fixed beam test
structure depicting the measurement
to be made, where Edge 1 is
considered an inside edge and Edge 5
is considered an outside edge.
To obtain the
following measurements, consult ASTM
standard test method E 2244 entitled
"Standard Test Method for In-Plane
Length Measurements of Thin,
Reflecting Films
Using an Optical Interferometer."
date data taken (optional) =
/
/
Table 1 - Preliminary
ESTIMATES
Description
1
material =
material
2
design length =
μm
design
length
3
which?
which iteration of the test structure
where "first" corresponds to the topmost or
leftmost test structure in
the column or array of the same material that has the specified length?
4
magnification =
×
magnification
5
orientation
=
orientation on the chip
6
calx =
x-calibration factor (for the given magnification)
7
interx
=
μm
interferometer's maximum field of view
(for the given magnification)
8
σxcal =
μm
one sigma
uncertainty in a ruler
measurement (for the given
magnification)
9
xres
=
μm
uncalibrated resolution
of the interferometer in the
x-direction
10
calz =
z-calibration factor (for the given magnification)
11
aligned?
alignment ensured ?
12
leveled?
data leveled ?
Table 2 -
INPUTS (uncalibrated values)
Notes
13
x1max
(i.e., x1upper)
=
μm
14
x1min
(i.e., x1lower)
=
μm
(x1min > x1max)
15
x5min
(i.e., x5upper)
=
μm
(x5min > x1min)
16
x5max
(i.e., x5lower)
=
μm
(x5max > x5min)
17
sep
=
μm
uncalibrated
pixel-to-pixel spacing (for the
given magnification)
(Each
of the standard uncertainty
components is obtained using a
Type B analysis.)
Report the results as follows: Since it can be assumed that the
estimated values of the
uncertainty
components are
approximately uniformly
or Gaussianly distributed with
approximate combined standard
uncertainty
ucL, the
in-plane length
is believed to lie in the
interval L
±
ucL (expansion factor
k=1) representing a level of
confidence of approximately 68 %.