Program Booklet [PDF]

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Monday and Tuesday, June 17-18 (Satellite Workshops)

In addition to registering for the workshops, people interested in attending or contributing to the workshops should contact the workshop chairs.
Mon 10:00 - 15:15
Mon 10:00 - 16:00
Mon 10:00 - 16:00
Tue 14:00 - 18:00
Tue 9:00 - 17:00
Tue 9:00 - 17:00

Wednesday, June 19

Plenary Session: Beamline Components
Location: Green Auditorium
Chair: Christie Nelson (NSLS)
9:00 - 9:45 Performance of a 1-D parabolic Be CRL to focus a pink beam from an undulator at the Advanced Photon Source
Eric M. Dufresne
9:45 - 10:30 Expected performance of cryogenic Si monochromator for high power density and high coherence ERL beamlines
Rong Huang
10:30 - 11:00 Coffee Break
11:00 - 11:30 Designing and Commissioning of a Prototype Double Laue Monochromator at CHESS
J. Y. Peter Ko
11:30 - 12:00 Performance Prediction of Hockey-Puck Silicon Crystal Monochromator at the Advanced Photon Source
Zunping Liu
12:00 - 12:30 Trends on X-ray Optics and Pinholes for Synchrotron Beamlines: large, nested, flat, curved, one or two dimensional, monolayer, multilayer or stripe multilayer & scatterless pinholes
Jörg Wiesmann
12:30 - 13:00 Poster Session Preview
13:00 - 14:00 Lunch
Afternoon Parallel Sessions (14:00 — 16:00)
A.   Sources and Insertion Devices  —  Chair: Efim Gluskin (APS)
Location: Green Auditorium
Scope: Novel insertion devices
14:00 - 14:30 Development of Compact, Tunable Undulators at the Cornell High Energy Synchrotron Source
Alexander Temnykh
14:30 - 15:00 The Latest Status of NSLS-II Insertion Devices
Toshi Tanabe
15:00 - 15:30 Completion of the Brightness Upgrade of the Advanced Light Source
Christoph Steier
15:30 - 16:00 Coffee Break
B.   IR/VUV - Timing  —  Chair: Aaron Lindenberg (LCLS/SLAC)
Location: Lecture Room A
Scope: Synchronization, fast detectors, choppers, applications, data handling
14:00 - 14:30 The Advanced Photon Source Upgrade Short-Pulse X-ray Beamline Facilities
Eric M. Dufresne
14:30 - 15:00 Timing and data acquisition at ALS beamline 6.0
Marcus Hertlein
15:00 - 15:30 New infrared beamline at the Brazilian Synchrotron Light Laboratory
Raul Freitas
15:30 - 16:00 Coffee Break
Afternoon Parallel Sessions (16:00 — 18:00)
C.   Sample Environment  —  Chair: Jacob Ruff (CHESS)
Location: Green Auditorium
Scope: Liquid jet for single-shot diffraction, high magnetic fields, deposition, environmental chambers, robotics, high pressure, bionanoprobe, etc.
16:00 - 16:30 Sample Environments for X-ray Scattering Studies of Soft Materials Processing
Detlef Matthias Smilgies
16:30 - 17:00 A Thermo-mechanical Loading Capability for In-situ Studies of Deformation of Crystalline Materials Using High-Energy Synchrotron X-rays
Darren Pagan
17:00 - 17:30 Containerless Sample Environments for in-situ Studies of Liquids and Glasses using High Energy X-ray Diffraction
Richard Weber
17:30 - 18:00 Using high energy x-rays and in situ testing environments to understand the behavior of structural materials
Matthew Peter Miller
D.   Applications  —  Chair: Dean Chapman (Canadian Light Source)
Location: Lecture Room A
Scope: Materials, biology, arts and archaeology, animal science
16:00 - 16:30 Modified Coin Cells for Operando X-Ray Analysis of Battery Materials
Katharine Silberstein
16:30 - 17:00 Cryo-SAXS as a Method for Measuring Low Resolution Macromolecular Structure without Radiation Damage
Jesse B. Hopkins
17:00 - 17:30 Undulator beamline of the Brockhouse sector at CLS
Beatriz Diaz
17:30 - 18:00 Preparing for a Warmer Future: Radiation Damage to Protein Crystals at Ultra-High Dose Rates
Matthew Warkentin
Wednesday Wrap-up
18:00 - 19:00 Poster Session in the Hall of Flags
Tentative info: Posters can be mounted throughout the day of the poster session, and each poster should be attended at least through a major part of the session. Posters should be removed immediately after the end of the poster session. The maximum allowable poster size is 4' x 4'.
19:00 No Host Dinner

Thursday, June 20

Plenary Session: Detectors
Location: Green Auditorium
Chair: Sol Gruner (CHESS)
Scope: X-ray detectors, pixel array detectors, energy resolving detectors, high spatial resolution detectors, detector calibrations and software, wide dynamic range detectors
9:00 - 9:45 Jungfrau, Mönch and Eiger: Detector development at the Swiss Light Source
Bernd Schmitt
9:45 - 10:30 Integrating Pixel Array Detectors for Both High and Low Fluence Measurements
Mark W. Tate
10:30 - 11:00 Coffee Break
11:00 - 11:30 ePix: a class of architectures for second generation LCLS cameras
Angelo Dragone
11:30 - 12:00 Scanning CCD Detector for Powder Diffraction
Timothy Madden
12:00 - 12:30 Using a Large Area CMOS Detector for Shutterless Collection of X-ray Diffraction Data
Al Thompson
Afternoon Parallel Sessions (12:30 — 15:30)
E.   Coherence  —  Chair: Ross Harder
Location: Green Auditorium
Scope: Lensless coherent imaging, metrology, ptychography, effects/limits of partial coherence
12:30 - 13:00 Brightness and Coherence of Improved Light Sources
Ivan Bazarov
13:00 - 13:30 Partially Coherent Wavefront Propagation Simulations: from Beamline Performance to Virtual Experiments
Lutz Wiegart
13:30 - 14:30 Lunch
14:30 - 15:00 The coherent x-ray imaging instrument
Garth Williams
15:00 - 15:30 Coffee Break
F.   X-Ray Spectroscopy  —  Chair: Cecilia Sanchez-Hanke (NSLS-II)
Location: Lecture Room A
Scope: Inelastic scattering, raman, x-ray emission, novel analyzers
12:30 - 13:00 Micron scale spatially resolving x-ray polychromator and 2D x-ray imaging schemes using spherical diffractive optics and pixel array detectors
Kenneth Hill
13:00 - 13:30 X-ray Emission Collected Using a Novel Energy Dispersion Method
Kenneth Finkelstein
13:30 - 14:30 Lunch
14:30 - 15:00 Novel Optics with Integrated Sample Environment for Hard X-ray Fluorescence Spectroscopy
Klaus Attenkofer
15:00 - 15:30 Coffee Break
Afternoon Session (15:30 — 18:00)
G.   Microscopy, Imaging  —  Chair: Chris Jacobsen (APS)
Location: Green Auditorium
Scope: Full-field imaging (including talbot), TXM, confocal, microbeams, tomography
15:30 - 16:00 Lithographically-fabricated channel arrays for confocal x-ray fluorescence microscopy and XAFS
Arthur R. Woll
16:00 - 16:30 Fourier Synthesis Illuminator for EUV mask inspection tool using a MEMS mirror
Markus P. Benk
16:30 - 17:00 An Energy Dispersive Bent Laue Monochromator for K-Edge Subtraction Imaging
Nazanin Samadi
17:00 - 17:30 Lensless imaging of Atomic Surface Structures via Ptychography
Chenhui Zhu
17:30 - 18:00 X-ray fluorescence and ptychographic imaging
David Vine
Thursday Wrap-up
19:00 - 21:00 Banquet at the Gaithersburg Hilton

Friday, June 21

Plenary Session: Future Optics
Location: Green Auditorium
Chair: Lahsen Assoufid (APS)
Scope: Novel diffractive devices, monochromators, focusing
9:00 - 9:45 3-D Reflection Zone Plates for X-Ray Monochromatization and Spectroscopy
Alexei Erko
9:45 - 10:30 Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV
Yuri Shvyd'ko
10:30 - 11:00 Coffee Break
11:00 - 11:30 Development of a super-polished bimorph mirror
Kawal Sawhney
11:30 - 12:00 The Adaptive X-Ray Optic Project at the Lawrence Livermore National Laboratory
Tom Pardini
12:00 - 12:30 Applications of CHESS single-bounce capillaries at synchrotron beamlines
Rong Huang
12:30 - 12:45 Closing remarks

Enabling Science and Innovation

Advances in synchrotron instrumentation, from sources through optics to detectors, have made possible the development of novel techniques to address pressing scientific questions that impact our daily life. SRI2013 is a forum to highlight these connections between synchrotron radiation instrumentation, science, and society.


  • Advanced Light Source
  • Advanced Photon Source
  • Center for Advanced Microstructures & Devices
  • Cornell High Energy Synchrotron Source
  • Canadian Light Source
  • Jefferson Lab
  • Linac Coherent Light Source
  • Laboratório Nacional de Luz Síncrotron
  • National Synchrotron Light Source
  • National Synchrotron Light Source - II
  • Synchrotron Radiation Center
  • Synchrotron Ultraviolet Radiation Facility
  • Stanford Synchrotron Radiation Lightsource


NIST; National Institute of Standards and Technology, U.S. Department of Commerce